DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
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2017-09-04 | 9001900009 | OPTICAL PLATE GLASS, mounted with an optically BILATERAL polishing applied in optoelectronics and microelectronics CIVIL ENGINEERING DESIGN FOR CAPACITY ON THEM layers of different materials quartz glass substrates SIEGERT WAFER GMBH SIEGE | *** | GERMANY | 0.3 | 981,27 | *** | ***** | ***** |
2017-09-04 | 9026202000 | CLASSIFICATION CODE 513,167.513168, Pressure sensors for monitoring and measuring the pressure in pneumatic packaging machine FOCKE. Principle of operation is based on changes in the electrical parameters of ceramic (Aluminum Oxide) wafer. DOES NOT CONTAIN COMPONENTS AND SOURCES: RA | *** | GERMANY | 0.08 | 259,87 | ST PETERSBURG | ***** | ***** |
2017-09-13 | 9026102900 | SPARE PARTS USED IN WIRE CUTTING MACHINE BRAND silicon wafer "MEYER BURGER", used in its own production:: Ultrasonic Sensors for liquid level, used to determine the abrasive ABRASIVE TANK. BAUMER ELEC | *** | GERMANY | 0.36 | 584,44 | *** | ***** | ***** |
2017-09-28 | 9026202000 | PRESSURE CONVERTER (SENSOR). INSTALLED IN GAS DISTRIBUTION CABINET HARDWARE FOR APPLICATION ACTIVE LAYERS on the glass and silicon wafers AT solar cell production. INTENDED FOR PRESSURE MONITOR SM. GAZORASPR SUPPLEMENT: IN | *** | GERMANY | 2.1 | 3262,7 | *** | ***** | ***** |
2017-10-03 | 9030820000 | Instruments and apparatus for measuring or checking semiconductor wafers or the device:. POSTAV.V RAZOBRAN.VIDE PARTLY FOR TRANSPORTATION FACILITIES, HAS RADIOELKTR.I VYSOKOCHAST.SRE-in, not the military. PURPOSE. EPS150TRIAX triaxial probe station PRETSIZ | *** | GERMANY | 112 | 33390,05 | *** | ***** | ***** |
2017-10-09 | 9031803400 | INSTRUMENTS AND ELECTRONIC DEVICES for measuring or checking geometrical quantities, USED IN THE LINE TYPE "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE ONLY FOR USE IN THICKNESS CPE | *** | GERMANY | 0.22 | 10394,19 | *** | ***** | ***** |
2017-10-09 | 9031803400 | INSTRUMENTS AND ELECTRONIC DEVICES for measuring or checking geometrical quantities, USED IN THE LINE TYPE "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE solely for use by the incremental | *** | GERMANY | 1.2 | 1164,52 | *** | ***** | ***** |
2017-10-09 | 9031803400 | INSTRUMENTS AND ELECTRONIC DEVICES for measuring or checking geometrical quantities, USED IN THE LINE TYPE "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE ONLY FOR USE IN THICKNESS OUT | *** | GERMANY | 0.2 | 4802,14 | *** | ***** | ***** |
2017-10-09 | 9031908500 | PARTS AND ACCESSORIES Measuring or checking instruments and appliances used in the line type "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE ONLY FOR USE AT OWN LOADING AND UNLOADING | *** | GERMANY | 34.05 | 75493,85 | *** | ***** | ***** |
2017-10-20 | 9030820000 | Instruments and apparatus for measuring or checking semiconductor wafers or devices not MILITARY BS TESTING STATION / STATION testing, including: - JT 5112 64-channel EXPANDER I / O (1 PCS); - JTVB / N IMAGING MODULE (1 PCS). | *** | GERMANY | 4 | 21928,47 | *** | ***** | ***** |