DATE | HS_CODE | Product Description | Trademark | Country | Net Weight | Statistical Cost | Place | Shipper Name | Consignee Name |
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2017-10-02 | 9031809100 | Other instruments, appliances and machines for measuring and monitoring of geometric quantities, etc., etc., Denmark ENCODER MN 105-14-00207 to measure the angle rotation of the shafts automatic installation BAKING wafer sheets HAAS-MEINCKE HAAS-MEINCKE 6272169 2 | *** | DENMARK | 0.52 | 1666,32 | *** | ***** | ***** |
2017-10-09 | 9031803400 | INSTRUMENTS AND ELECTRONIC DEVICES for measuring or checking geometrical quantities, USED IN THE LINE TYPE "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE ONLY FOR USE IN THICKNESS CPE | *** | GERMANY | 0.22 | 10394,19 | *** | ***** | ***** |
2017-10-09 | 9031803400 | INSTRUMENTS AND ELECTRONIC DEVICES for measuring or checking geometrical quantities, USED IN THE LINE TYPE "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE solely for use by the incremental | *** | GERMANY | 1.2 | 1164,52 | *** | ***** | ***** |
2017-10-09 | 9031803400 | INSTRUMENTS AND ELECTRONIC DEVICES for measuring or checking geometrical quantities, USED IN THE LINE TYPE "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE ONLY FOR USE IN THICKNESS OUT | *** | GERMANY | 0.2 | 4802,14 | *** | ***** | ***** |
2017-10-09 | 9031908500 | PARTS AND ACCESSORIES Measuring or checking instruments and appliances used in the line type "WIS", FOR THE PURPOSE OF QUALITY CONTROL AND SORTING silicon wafers are imported FREE ONLY FOR USE AT OWN LOADING AND UNLOADING | *** | GERMANY | 34.05 | 75493,85 | *** | ***** | ***** |
2017-10-10 | 9031410000 | Optical devices for wafer CHECK: Setting the measurement noise equivalent temperature difference METS. DOES NOT CONTAIN sources of ionizing radiation, radio-electronic means and high frequency devices. COMPOSITION EQUIPMENT: METS-S-1 | *** | ISRAEL | 192 | 58031,87 | *** | ***** | ***** |
2017-10-12 | 9031803200 | Devices, devices and electronic machines for measuring or checking geometrical quantities FOR CHECKING semiconductor wafers or devices or for inspecting photomasks or photomask, NEW, for cars "MERCEDES-BENZ": POSITION SENSOR P | *** | HUNGARY | 0.25 | 107,96 | *** | ***** | ***** |
2017-10-24 | 9031803800 | CABINET DOWNLOADS chemicals, designed for control and SUPPLY reagents in organic chemical processing of semiconductor wafers, a partially exploded view, YEAR - 2017, packed in a wooden box CABINET DOWNLOADS chemicals, | *** | UNITED KINGDOM | 630 | 319200 | *** | ***** | ***** |
2017-10-25 | 9031803200 | OTHER DEVICES, DEVICE AND MACHINE ELEKTR.DLYA measuring or checking GEOMETRICH.VELICHIN to test semiconductor wafers OR DEVICE OR In inspecting photomasks or photomask ISPOLZ.V semiconductor manufacturing,, compound is contacted | *** | UNITED STATES | 0.25 | 2820 | *** | ***** | ***** |